ISHS Acta Horticulturae 599: International Conference: Postharvest Unlimited
NIR/MIR DUAL-SENSOR VISION SYSTEM FOR APPLE DEFECT AND STEM-END/ CALYX ON-LINE RECOGNITION |
| Authors: | Y. Tao, X. Cheng, Y.R. Chen, Y. Luo |
| Keywords: | Infrared, Machine vision, Imaging, Dual-wavelength sensing, Defect inspection, Stem-end, Calyx, Apple. |
| Abstract:
One of the difficult problems in automated machine vision apple sorting is the distinction between true defects and the stem-end/calyx. To solve this problem, a dual imaging approach using near infrared (NIR) and mid-infrared (MIR) was developed for combined sensing. Based on this method, the MIR is sensitive to the stem-end/calyx, whereas the NIR is sensitive to both stem-end/calyx and defects. Through image processing of combined images, the distinction is achieved. Experiments show the robustness of the method for on-line defect sorting of apples. | |
Download Adobe Acrobat Reader (free software to read PDF files) | |
