|Authors: ||T. Litschmann, R. Vávra, V. Falta, A. Bílková, I. Zdárská|
|Keywords: ||surface measurement, leaf growth, non-destructive method, Venturia inaequalis, growing season|
Scanning of the leaves of four apple cultivars at weekly intervals during the 2012 growing season made it possible to calculate their surface area.
The calculation of the surface area of scanned leaves revealed that the leaf surface area is determined by the multiplication of the leaf width and leaf length, which is then multiplied by the factor 0.71. Measurement of the leaf width and the leaf length on annual shoots in the years 2013 and 2014 at weekly intervals during the growing season made it possible to calculate the leaf surface area using a non-destructive method.
Monitoring of the number of leaves and measurement of the leaf area of four apple cultivars, 'Idared', 'Golden Delicious', 'Melrose' and 'Rubín', during the growing season showed that the change in the leaf area surface has a very close algorithmic relationship to the ambient temperature condition characterized by the daily sum of effective temperatures above 5°C.
Download Adobe Acrobat Reader (free software to read PDF files)
URL www.actahort.org Hosted by KU Leuven